SVDV-ICP-OES is a technique used for the detection of elements at trace (parts of million) levels in numerous sample types, which provides a highly reliable technique due to good stability, limited spectral interferences and low matrix effects. The recent advances in EDS performance with the silicon drift detector (SDD) enable. Our robust family of Thermo Scientific ARL XRF spectrometers provides fast, repeatable elemental analysis measurements with little to no sample preparation. Advanced models — such as the SPECTRO xSORT handheld XRF spectrometer from SPECTRO Analytical Instruments — produce fast, accurate results on the spot, for sample identification, gra e sorting, and metals analysis. Energy Dispersive Spectroscopy, also knows as EDS or EDX, and sometimes even as EDAX is a non-destrutive way to get the elemental composition of an element. The system is very affordable with high reliable and quality. It delivers high sensitivity, a wide dynamic range and strong tolerance for complex matrices, making it ideal for pharmaceutical and food.
[PDF Version]